MCU test device for multiple integrated circuit chips

Details MCU test device for multiple integrated circuit chips MCU test device for multiple integrated circuit chips

2007-03-06

2007-03-06

Nguyen, Vinh P. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S755090

Reexamination Certificate

active

10881623

ABSTRACT:
A testing device for testing integrated circuits is disclosed including a first board configured to connect to a specific integrated circuit being tested. A second board is removably connected to the first board and is configurable to test a variety of integrated circuits. An MCU located on the second board controls the testing of the specific integrated circuit being tested. At least one connector enables connection between the first board and the second board.

REFERENCES:
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patent: 4539517 (1985-09-01), Flora
patent: 4768195 (1988-08-01), Stoner et al.
patent: 5163052 (1992-11-01), Evans et al.
patent: 5898704 (1999-04-01), Kawano
patent: 6622272 (2003-09-01), Haverkamp et al.

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