Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-02-15
2005-02-15
Karlsen, Ernest (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010, C324S762010
Reexamination Certificate
active
06856160
ABSTRACT:
A method of generating an operating condition projection corresponding to a predetermined lifetime for semiconductor devices is disclosed. The disclosed method includes collecting lifetime information from a plurality of semiconductor devices at more than one stress condition by inducing a predetermined drain-source voltage for each stress condition. The method also includes determining the median lifetime for semiconductor devices at each of the stress conditions. Further, the method includes calculating a lifetime at each stress condition at which a predetermined percentage of the devices will exceed and extrapolating the lifetime for devices used at operating conditions.
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Kim Hyeon-Seag
Marathe Amit P.
Yang Nian
Yang Tien-Chun
Advanced Micro Devices , Inc.
Foley & Lardner LLP
Karlsen Ernest
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