Maximum time interval error test signal generating apparatus...

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Synchronizing

Reexamination Certificate

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Reexamination Certificate

active

06972603

ABSTRACT:
An MTIE test signal generating apparatus generates a predetermined MTIE test signal. An MTIE measuring unit includes a low-pass measuring filter having a predetermined high-cut characteristic. A cycle-amplitude setting portion sets a cycle corresponding to an observation time of each of desired plural specific points for a predetermined MTIE characteristic and an amplitude corresponding to a difference in the MTIE value between adjacent specific points. Plural signal generating portions generate plural signals each having the cycle and the amplitude having repetitive waveforms and then outputting to each of the desired plural specific points. A holding time setting portion sets a holding time for holding the upper and lower limit values of the repetitive waveforms over the predetermined time so that a signal cycle having at least the shortest cycle of the plural signals is longer than a predetermined time corresponding to the predetermined high-cut characteristic of the low-pass measuring filter.

REFERENCES:
patent: 6184810 (2001-02-01), Burns
patent: 6246738 (2001-06-01), Acimovie et al.
patent: 6658612 (2003-12-01), Park et al.
patent: 6768360 (2004-07-01), Tsuruki
patent: 6798830 (2004-09-01), Tharakan
patent: 2001/0044701 (2001-11-01), Ballantyne et al.
patent: 1 152 562 (2001-11-01), None
ITU-T G.812; Telecommunication Standardization Section of ITU; Series G: Transmission Systems and Media, Digital Systems and Networks; Jun. 1998.
ITU-T O.172; Telecommunication Standardization Section of ITU; Series O: Specifications of Measuring Equipment; Mar. 2001.
ITU-T O.172; Telecommunication Standardization Section of ITU; Series O: Specifications of Measuring Equipment; Mar. 2003.

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