Matrix type surface pressure distribution detecting element

Details Matrix type surface pressure distribution detecting element Matrix type surface pressure distribution detecting element

1993-03-02

1995-03-28

Chilcot, Jr., Richard E.

Measuring and testing

Dynamometers

Responsive to multiple loads or load components

382 4, G06K 900

Patent

active

054006627

ABSTRACT:
A surface pressure distribution matrix of detecting elements requires no positioning operation during a manufacturing process and does not vary in sensitivity depending on where surface pressure is applied to the matrix. A large number of transistors in a matrix form are formed on a single semiconductor substrate. A flexible film having a conductive coating is formed over the matrix of detecting elements. The collector electrodes of a plurality of transistors are commonly connected to each other to form rows in the matrix, each row being electrically isolated from the other rows. The base electrodes of the plurality of transistors are commonly connected to each other to form columns in the matrix, each column being electrically isolated from the other columns. When the flexible film receives a surface pressure from the ridges of a fingerprint, the depressed portions of the conductive coating on the film are brought into contact with the matrix of detecting elements. As a result, the transistors in the matrix turn on in the pattern of the fingerprint ridges. Shift registers scan the on/off states in the matrix of transistors to detect the fingerprint pattern. One embodiment uses bipolar transistors. Another embodiment uses MOS field effect transistors.

REFERENCES:
patent: 3781855 (1973-12-01), Killen
patent: 4429413 (1984-01-01), Edwards
patent: 4577345 (1986-03-01), Abramov

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