Materials and methods for low pressure chemical-mechanical...

Abrading – Abrading process – Glass or stone abrading

Reexamination Certificate

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C451S057000

Reexamination Certificate

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06918821

ABSTRACT:
Provided are materials and methods for the chemical mechanical planarization of material layers using a down force of less than about 2.5 psi while maintaining a material removal rate generally similar to that obtained using higher down forces while simultaneously improving the selectivity of the process with respect to a primary material formed over a barrier material. The materials and methods disclosed herein are suitable for use in meatallization operations during semiconductor device fabrication, in particular in processes in which the primary material is a softer metal such as copper and the barrier material is a harder material such as a metal nitride.

REFERENCES:
patent: 6019670 (2000-02-01), Cheng et al.
patent: 6685540 (2004-02-01), Cherian et al.
patent: 2003/0013387 (2003-01-01), Tsai et al.

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