Material measurement system for obtaining coincident...

Optics: measuring and testing – Range or remote distance finding – With photodetection

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C356S005010, C356S004010, C162S049000, C162S198000, C162S263000

Reexamination Certificate

active

07609366

ABSTRACT:
A material measurement system (500) includes a THz generator including at least one laser source (111) for emitting optical pulses, the optical pulses coupled to a THz emitter (51) operable for emitting pulsed THz radiation at a sample location on material while being processed (14) by a manufacturing system. A receiver (52) is operable to receive the optical pulses and to detect reflected or transmitted THz radiation from the sample location (14) synchronously with the optical pulses and provide electrical detection signals. Synchronizing optics (112, 113, 114) is operable to receive the optical pulses from said laser and provide the optical pulses to both the receiver (52) and the THz emitter (51). A controller (25) includes at least one processor (87) for receiving the electrical detection signals and providing a processed electrical detection signal, and an analyzer (88) operable to determine at least one, and generally a plurality of properties of the material from the processed electrical detection signal.

REFERENCES:
patent: 4879471 (1989-11-01), Dahlquist
patent: 5659392 (1997-08-01), Marcus et al.
patent: 6627043 (2003-09-01), Mantylia
patent: 2005/0030520 (2005-02-01), Wada et al.
patent: 2006/0132796 (2006-06-01), Haran
patent: 2006/0243931 (2006-11-01), Haran et al.
patent: 2007/0137823 (2007-06-01), Haran
patent: 2007/0235658 (2007-10-01), Zimdars et al.
patent: 2008/0179528 (2008-07-01), Demers

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Material measurement system for obtaining coincident... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Material measurement system for obtaining coincident..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Material measurement system for obtaining coincident... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4064378

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.