Material measure and position measuring device comprising...

Details Material measure and position measuring device comprising... Material measure and position measuring device comprising...

2005-01-18

2005-01-18

Porta, David (Department: 2878)

Radiant energy

Luminophor irradiation

Methods

C250S458100, C250S484400

Reexamination Certificate

active

06844558

ABSTRACT:
A material measure includes a carrier substrate having a surface that includes at least one track having first porous subsections and second subsections. The first porous subsections and the second subsections are arranged alternatingly in at least one direction and have different optical properties. The first porous subsections are formed so as to be photoluminescent and the second subsections are formed so as to be non-photoluminescent. A scanning unit may also be provided, wherein the scanning unit is movable relative to the material measure and includes at least one opto-electronic detector element and a light source. The light source applies radiation of a defined wavelength to the material measure, the radiation from the light source being suitable for exciting the photoluminescence in the first subsections of the material measure.

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A.G. Cullis et al., “The Structural and Luminescence Properties of Porous Silicon,” Journal of Applied Physics, Aug. 1, 1997, pp. 909 to 965 (American Institute of Physics 1997).

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