Measuring and testing – Specimen stress or strain – or testing by stress or strain...
Reexamination Certificate
2005-01-14
2008-11-18
Raevis, Robert R (Department: 2856)
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
C324S228000
Reexamination Certificate
active
07451657
ABSTRACT:
Methods are described for assessing material condition. These methods include the use of multiple source fields for interrogating and loading of a multicomponent test material. Source fields include electric, magnetic, thermal, and acoustic fields. The loading field preferentially changes the material properties of a component of the test material, which allows the properties of the component materials to be separated. Methods are also described for monitoring changes in material state using separate drive and sense electrodes with some of the electrodes positioned on a hidden or even embedded material surface. Statistical characterization of the material condition is performed with sensor arrays that provide multiple responses for the material condition during loading. The responses can be combined into a statistical population that permits tracking with respect to loading history. Methods are also described for measuring the stress in the material by independently estimating effective electrical properties, such as magnetic permeability or electrical conductivity, using layered models or predetermined spatial distributions with depth that are then correlated with the stress.
REFERENCES:
patent: 4059987 (1977-11-01), Dowling et al.
patent: 4281533 (1981-08-01), Eesley et al.
patent: 4332157 (1982-06-01), Zemel et al.
patent: 4341113 (1982-07-01), Gutzwiller, Jr.
patent: 4453405 (1984-06-01), Zemel
patent: 4551425 (1985-11-01), Zemel
patent: 4656869 (1987-04-01), Zacharias
patent: 4814690 (1989-03-01), Melcher et al.
patent: 4851773 (1989-07-01), Rothstein
patent: 5453689 (1995-09-01), Golfine et al.
patent: 5570017 (1996-10-01), Blum
patent: 5793206 (1998-08-01), Goldfine et al.
patent: 6063264 (2000-05-01), Haritatos
patent: 6071563 (2000-06-01), Kozlowski et al.
patent: RE36986 (2000-12-01), Melcher
patent: 6188218 (2001-02-01), Goldfine et al.
patent: 6380747 (2002-04-01), Goldfine et al.
patent: 6425686 (2002-07-01), Zaldivar et al.
patent: 6486673 (2002-11-01), Goldfine et al.
patent: 6514631 (2003-02-01), Yamamoto et al.
patent: 6643393 (2003-11-01), Van et al.
patent: 6657429 (2003-12-01), Goldfine et al.
patent: 6734668 (2004-05-01), Hils et al.
patent: 6781387 (2004-08-01), Goldfine et al.
patent: 6784662 (2004-08-01), Schlicker et al.
patent: 2002/0075006 (2002-06-01), Goldfine et al.
patent: 2002/0158626 (2002-10-01), Shay et al.
patent: 2002/0163333 (2002-11-01), Schlicker et al.
patent: 2004/0225474 (2004-11-01), Goldfine et al.
patent: 2005/0083032 (2005-04-01), Goldfine et al.
patent: 2 279 044 (1976-02-01), None
Craven Christopher A.
Goldfine Neil J.
Grundy David C.
Lyons Robert J.
Schlicker Darrell E.
Hamilton Brook Smith & Reynolds P.C.
JENTEK Sensors, Inc.
Raevis Robert R
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