Material characterization

Details Material characterization Material characterization

1989-01-09

1989-09-12

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

324 585C, G01R 2726, G01R 2704

Patent

active

048663700

ABSTRACT:
A method of characterizing a material uses an element in which microwaves can propagate and can resonate, such as a weakly-coupled isolated microstrip device or a microwave cavity, arranged so that fringing fields from the element interact with the material. Microwaves are coupled into the element at a frequency near a resonance, and a modulating signal is applied so as to modulate the response of the element. Measurements of both the mean response and the modulation of the response enable the dielectric constant and dielectric loss of the material to be determined. Modulation may be applied to the frequency of the microwaves, or to the electrical parameters of the element.

REFERENCES:
patent: 3586971 (1971-06-01), Bosisio
patent: 4270083 (1981-05-01), Fitzky et al.
patent: 4277741 (1981-07-01), Faxvog et al.
patent: 4453125 (1984-06-01), Kimura et al.

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