Material analyzing apparatus and method

Details Material analyzing apparatus and method Material analyzing apparatus and method

1975-07-17

1977-07-05

Myracle, Jerry W.

Measuring and testing

Surface and cutting edge testing

Roughness

73 156, G01N 332

Patent

active

RE0292885

ABSTRACT:
An analyzing structure and method for determining properties such as elastic shear modulus and mechanical hysteresis of a material. A pair of mutually spaced holders hold the sample in such a way that the holders are interconnected by the sample, and these holders are in turn carried by driver and driven supports. A drive sets the driver support into vibratory motion so that the latter is transmitted through the sample to the driven support. By detecting the manner in which the driver and driven supports vibrate it is possible to determine properties of the sample. The sample is tested by cyclically generating substantially pure shear forces in the sample, with the power required to sustain the vibrations of the sample at a constant level being measured to determine the damping of the sample and the frequency of vibration being measured to determine the modulus of the sample.

REFERENCES:
patent: 2178252 (1939-10-01), Forster
patent: 2593389 (1952-04-01), Nielsen
patent: 3501952 (1970-03-01), Gergen et al.
patent: 3699808 (1972-10-01), Ford et al.

Affiliated with

Also associated with

Rating

Material analyzing apparatus and method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Material analyzing apparatus and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Material analyzing apparatus and method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-568791