Material analysis using reflected light

Details Material analysis using reflected light Material analysis using reflected light

1984-10-29

1986-12-16

Evans, F. L.

Optics: measuring and testing

By dispersed light spectroscopy

356319, 356446, G01J 342

Patent

active

046293221

ABSTRACT:
An apparatus and method for determining the relative proportions of two eents of a ternary compound from light reflected off a sample of the compound. The light is varied in wavelength and a graph of reflectance vs wavelength is stored. For a given compound of general form A.sub.x B.sub.1-x C, x may be determined by converting the stored graph to a graph of reflectance vs photon energy of the light, determining the photon energy of the light for the longest wavelength peak on the converted graph, and computing x from the equation E.sub.1 =a+bx+cx.sup.2 wherein a, b, and c are predetermined constants, and E.sub.1 is the photon energy in electron volts of the peak of interest.

REFERENCES:
patent: 4142802 (1979-03-01), Pollak et al.

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