Material analysis

Thermal measuring and testing – Temperature measurement – In spaced noncontact relationship to specimen

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C250S350000, C250S341600, C250S341800

Reexamination Certificate

active

07018094

ABSTRACT:
In thermography apparatus, a lamp102is modulated sinusoidally and a camera106captures thermal images at the modulated frequency, but delayed by an adjustable preset delay. A signal delay box107is connected between a sinusoidal modulation signal function generator104and the camera106. The delay box introduces a delay to the function generator signal so that the thermal image is captured after a period of time, resulting in an enhanced image.

REFERENCES:
patent: 3808439 (1974-04-01), Renius
patent: 3855864 (1974-12-01), Douglas
patent: 4416552 (1983-11-01), Hessemer, Jr. et al.
patent: 4589783 (1986-05-01), Thomas et al.
patent: 4632561 (1986-12-01), Rosencwaig et al.
patent: 4686222 (1987-08-01), Atkinson et al.
patent: 4792683 (1988-12-01), Chang et al.
patent: 4797555 (1989-01-01), La Mar
patent: 4818102 (1989-04-01), Glenn
patent: 4818118 (1989-04-01), Bantel et al.
patent: 4872762 (1989-10-01), Koshihara et al.
patent: 4874948 (1989-10-01), Cielo et al.
patent: 4875175 (1989-10-01), Egee et al.
patent: 4950897 (1990-08-01), Mandelis et al.
patent: 4987496 (1991-01-01), Greivenkamp, Jr.
patent: 5068799 (1991-11-01), Jarrett, Jr.
patent: 5287183 (1994-02-01), Thomas et al.
patent: 5302824 (1994-04-01), Prager
patent: 5365065 (1994-11-01), Power
patent: 5374122 (1994-12-01), Devitt et al.
patent: 5568978 (1996-10-01), Johnson et al.
patent: 5654977 (1997-08-01), Morris
patent: 5667300 (1997-09-01), Mandelis et al.
patent: 5706094 (1998-01-01), Maris
patent: 5711603 (1998-01-01), Ringermacher et al.
patent: 5881178 (1999-03-01), Tsykalov et al.
patent: 6000844 (1999-12-01), Cramer et al.
patent: 6104942 (2000-08-01), Kruger
patent: 6234016 (2001-05-01), Bonne et al.
patent: 6419387 (2002-07-01), Legrandjacques et al.
patent: 6437334 (2002-08-01), Thomas et al.
patent: 6488405 (2002-12-01), Eppes et al.
patent: 6517236 (2003-02-01), Sun et al.
patent: 6517238 (2003-02-01), Sun et al.
patent: 6542849 (2003-04-01), Sun
patent: 6595685 (2003-07-01), Baba et al.
patent: 6690016 (2004-02-01), Watkins et al.
patent: 6712502 (2004-03-01), Zalameda et al.
patent: 6756591 (2004-06-01), Lounis et al.
patent: 6860350 (2005-03-01), Beuhler et al.
patent: 2002/0018510 (2002-02-01), Murphy et al.
patent: 2002/0126732 (2002-09-01), Shakouri et al.
patent: 2002/0131476 (2002-09-01), Baba et al.
patent: 2003/0202556 (2003-10-01), Taketoshi et al.
patent: 2004/0050164 (2004-03-01), Bates
patent: 35 20 777 (1985-11-01), None
patent: 0 089 760 (1983-09-01), None
patent: 0 919 802 (1999-06-01), None
patent: 2 092 856 (1982-08-01), None
patent: 2 235 604 (1991-03-01), None
patent: 2 293 648 (1996-04-01), None
patent: 02284087 (1990-11-01), None
Front Flash Thermal Imaging Characterization of Continuous Fiber Ceramic Composites by Deemer et al. 1999.
Phase Infrared Thermography by Maldague et al. 1996.
NN85123037. Transient Thermal Imaging System. Dec. 1985.
Roth D J et al; “Thermographic Imaging for High-Temperature Composite Materials- A Defect Detection Study”; Research in Nondestructive Evaluation, US, Springer Verlag, vol. 9, No. 3, 1997, pp. 147-169, XP000863003.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Material analysis does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Material analysis, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Material analysis will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3600501

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.