Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Reexamination Certificate
2007-11-20
2007-11-20
Chaney, Carol (Department: 1773)
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
Specified electrical sensor or system
C427S127000, C360S017000, C360S135000, C369S280000, C428S848400
Reexamination Certificate
active
11366411
ABSTRACT:
In a master carrier for magnetic transfer which comprises a support that has a transfer-recording pattern arrayed in the track direction thereof in accordance with the information to be transferred to a magnetic recording medium, and a magnetic layer formed on the transfer-recording pattern of the support, the in-plane distance L (mm) between the hill and the valley of the warped master carrier, the vertical-direction distance H (μm) between the two, and the thickness d (mm) of the master carrier are so defined that they satisfy a relation of 0.05≦H·d3/L≦0.6.
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patent: 10-40544 (1998-02-01), None
Translation JA 10-40544.
Fujiwara Naoto
Nishikawa Masakazu
Chaney Carol
de Falasco Louis
Fujifilm Corporation
Sughrue & Mion, PLLC
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