Massively parallel detection

Details Massively parallel detection Massively parallel detection

1996-09-26

1998-12-29

Stucker, Jeffrey

Optics: measuring and testing

For light transmission or absorption

Of fluent material

356417, 356 73, G01N 2100

Patent

active

058546847

ABSTRACT:
The invention provides apparatuses for detecting light from, for example, closely spaced detection sites. In one embodiment, the invention provides an apparatus for measuring the amount of light emitted from a first set of two or more detection sites on a planar substrate while spatially resolving the measurements from each first set detection site, the apparatus comprising: a source of a light beam directed towards the planar substrate at a first angle; one or more lenses for focusing light emitted or reflected from each of the first set detection sites and having a second angle having an angle offset from the first angle, onto a unique area of an array detector; and the array detector comprising a plurality of light responsive pixels, wherein for each first detection site there is at least one light responsive pixel that receives light emitted or reflected from that detection site and substantially no cross-talk from another detection site, and wherein substantially none of the light from the light source intersects with the array detector.

REFERENCES:
patent: 5233174 (1993-08-01), Zmek
patent: 5428451 (1995-06-01), Lea
patent: 5461481 (1995-10-01), Bowen et al.

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