Radiant energy – Ionic separation or analysis – Static field-type ion path-bending selecting means
Patent
1989-12-11
1990-08-28
Anderson, Bruce C.
Radiant energy
Ionic separation or analysis
Static field-type ion path-bending selecting means
250297, H01J 4932
Patent
active
049528033
ABSTRACT:
A double focusing mass spectrometer is used as the second mass analyzer of a Mass Spectrometry/Mass Spectrometry Instrument comprising a uniform electric field and a magnetic sector. Fragment ions produced from precursor ions of a certain ionic species are introduced into a uniform electric field. The fragment ions travel along parabolic orbits and are separated according to their respective energy levels. The separated fragment ions are introduced into a magnetic sector and are dispersed according to their mass by the magnetic sector. A two-dimensional ion detector is disposed along a focal plane of the magnetic sector in order to simultaneously detect the fragment ions and to obtain a spectrum of the fragment ions.
REFERENCES:
patent: 3916188 (1975-10-01), Devienne
patent: 3944827 (1976-03-01), Matsuda
patent: 4171482 (1979-10-01), Vastel
patent: 4435642 (1984-03-01), Neugebauer et al.
patent: 4472631 (1984-09-01), Enke et al.
patent: 4553029 (1985-11-01), Matsuda
F. M. McLafferty, Tandem Mass Spectrometry, pp. 239-286 (John Wiley, & Son).
Anderson Bruce C.
Jeol Ltd.
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