Radiant energy – Ionic separation or analysis – Cyclically varying ion selecting field means
Reexamination Certificate
2005-11-22
2005-11-22
Wells, Nikita (Department: 2881)
Radiant energy
Ionic separation or analysis
Cyclically varying ion selecting field means
C250S281000, C250S42300F
Reexamination Certificate
active
06967326
ABSTRACT:
An apparatus includes a semiconductor or dielectric wafer-substrate and first and second multi-layer structures located over the wafer-substrate. The first multi-layer structure includes an ionizer or an electronic ion detector. The second multi-layer structure includes an ion trap having entrance and exit ports. The ionizer or electronic ion detector has a port coupled to one of the ports of the ion trap.
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Pai Chien-Shing
Pau Stanley
Taylor Joseph Ashley
Leybourne James J.
Lucent Technologies - Inc.
McCabe John F.
Wells Nikita
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