Mass spectrometer with superimposed electric and magnetic fields

Details Mass spectrometer with superimposed electric and magnetic fields Mass spectrometer with superimposed electric and magnetic fields

1976-06-22

1977-10-18

Church, Craig E.

Radiant energy

Ionic separation or analysis

Static field-type ion path-bending selecting means

250295, 250296, H01J 3934

Patent

active

040547965

ABSTRACT:
A mass spectrometer comprising superimposed electric and magnetic fields arranged substantially at right angles. The central orbit of the ion beam produced by an ion source is located on an equipotential surface in the electric field. The ion beam is accelerated by a means for producing a constant accelerating voltage. The electric field is swept by a sweep means. The change of the focal length of the superimposed field when the electric field is swept by said sweep means is compensated by a compensating means, thereby providing a mass spectrometer capable of measuring ions having a wide range of mass to charge ratios and capable of scanning at high speed and having a high accuracy mass marker.

REFERENCES:
patent: 3816748 (1974-06-01), Harrison
patent: 3984682 (1976-10-01), Matsuda

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