Radiant energy – Ionic separation or analysis – Static field-type ion path-bending selecting means
Patent
1991-12-09
1992-11-24
Anderson, Bruce C.
Radiant energy
Ionic separation or analysis
Static field-type ion path-bending selecting means
250297, B01D 5944, H01J 4900
Patent
active
051665182
ABSTRACT:
A mass spectrometer comprising ion source means (1) for producing ions characteristic of a sample to be analysed; ion detector means (14) for receiving at least some of said ions; magnetic sector analyzing means (18) and electrostatic analyzing means (8) disposed in any order between said ion source means (1) and said ion detector means (14); wherein said magnetic sector analyzing means (18) comprises means for dispersing ions according to their mass-to-charge ratios and for transmitting ions whose mass-to-charge ratios lie within a predetermined range and have a first kinetic energy; said electrostatic analyzing means (8) comprises means for generating an electrostatic field for deflecting ions having different kinetic energies around different curved trajectories such that ions having a second kinetic energy, lower than said first kinetic energy, are deflected around a central curved trajectory (15) and transmitted through said electrostatic analyzing means (8), and the strength of said electrostatic field is substantially equal to the strength of a similar reference field multiplied by the ratio of said second and said first kinetic energies when the strength of said reference field is that necessary to deflect ions having said first kinetic energy around said central curved trajectory (15); and means (11) are provided prior to said magnetic sector analyzing means for changing the kinetic energy of ions to said first kinetic energy and (4) prior to said electrostatic analyzing means for changing the kinetic energy of ions to said second kinetic energy.
REFERENCES:
patent: 3233099 (1966-02-01), Berry et al.
patent: 3886357 (1975-05-01), Naito
patent: 3950691 (1976-04-01), Evans
patent: 4766314 (1988-08-01), Jung
Retardation Lens Used to Improve the Abundance Sensitivity of a Mass Spectrometer, Freeman, Daly and Powell, Rev-Sci. Instrum. 1967, vol. 38(7), pp. 945-948.
Ion-Retarding Lens to Improve the Abundance Sensitivity of Tandem Mass Spectrometers, Kaiser and Stevens, AEC Research and Development Report, Nov. 1967.
Ion Focusing Properties of a "Thick" Retardation Lens, Merrill, Calkins and Peterson, Twenty-Seventh Annual Conference on Mass Spectrometry and Allied Topics, Jun. 3-8, 1979, pp. 334-335.
A Three Stage Mass Spectrometer, White, Rourke and Sheffield, Applied Spectroscopy, Nov. 2, 1958, pp. 46-53.
The Vg Sector 54 With 30cm Electrostatic Filter for High Abundance Sensitivity Measurements of Very Low Abundance Isotopes, Palacz & Walder, Adv. Mass Spectrom, UK, 11 Apr. 1990.
Mass Spectrometer with Electrostatic and Magnetic Prisms, Kel'man, Rodnikova and Uteev, Soviet Physics-Doklady, vol. 14, No. 2, Aug. 1969, pp. 155-157.
Prism Mass Spectrometer with Energy Focusing, Kel'man, Rodnikova and Finogenov, Soviet Physics--Technical Physics, vol. 16, No. 1, Jul. 1971, pp. 130-135.
Advantages of a Second Electric Sector on a Double-Focusing Mass Spectrometer of Reversed Configuration, Gilhaus, Boyd, et al., International Journal of Mass Spectrometry and Ion Process, 67 (1985), pp. 209-227.
Anderson Bruce C.
Fisons plc
LandOfFree
Mass spectrometer with electrostatic energy filter does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Mass spectrometer with electrostatic energy filter, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Mass spectrometer with electrostatic energy filter will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-923888