Mass spectrometer method and apparatus for analyzing materials

Details Mass spectrometer method and apparatus for analyzing materials Mass spectrometer method and apparatus for analyzing materials

1990-06-22

1991-10-08

Anderson, Bruce C.

Radiant energy

Ionic separation or analysis

Methods

250288, B01D 5944, H01J 4900

Patent

active

050556770

ABSTRACT:
A method and apparatus for analyzing a material by: forming and injecting into a vacuum chamber of a mass spectrometer a supersonic molecular beam of a carrier gas mixed with a sample of the material to be analyzed; ionizing the material in the supersonic molecular beam; mass-separating the ions according to their mass; and detecting the mass-separated ions of the material to be analyzed. The ions in the supersonic molecular beam may be filtered from ions of the thermal background molecules and carrier gas after the ionizing step but before the detecting step. The detected ions may then be used for identifying the material.

REFERENCES:
patent: 4845367 (1989-07-01), Amirav et al.
patent: 4863491 (1989-09-01), Brandt et al.
patent: 4911805 (1990-03-01), Ando et al.
patent: 4960992 (1990-10-01), Vestal et al.
patent: 4977785 (1990-12-01), Willoughby et al.

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