Mass spectrometer for ultra-rapid scanning

Details Mass spectrometer for ultra-rapid scanning Mass spectrometer for ultra-rapid scanning

1977-12-27

1979-10-16

Anderson, Bruce C.

Radiant energy

Ionic separation or analysis

Static field-type ion path-bending selecting means

250298, 250299, B01D 5944, H01J 3934

Patent

active

041714822

ABSTRACT:
The invention relates to a mass spectrometer for rapid scanning. A magnetic sector focuses a collimated beam containing the various ion species in a focal plane. The focused beams reach this focal plane at an angle of 45.degree.. The beams emerging from this focal plane are refocused in an electrostatic deflector having parallel plates. One of these plates is provided with a slit through which the beams are received. Scanning is brought about by varying the voltage applied to the electrostatic deflector.

REFERENCES:
patent: 3194961 (1965-07-01), Wald et al.
patent: 3475604 (1969-10-01), Noda et al.

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