Radiant energy – Ionic separation or analysis – With sample supply means
Reexamination Certificate
2006-02-15
2008-12-02
Berman, Jack I (Department: 2881)
Radiant energy
Ionic separation or analysis
With sample supply means
C250S282000, C250S299000, C250S300000
Reexamination Certificate
active
07459677
ABSTRACT:
Mass spectrometers for trace gas leak detection and methods for operating mass spectrometers are provided. The mass spectrometer includes an ion source to ionize trace gases, such as helium, a magnet to deflect the ions and a detector to detect the deflected ions. The ion source includes an electron source, such a filament. The method includes operating the electron source at an electron accelerating potential relative to an ionization chamber sufficient to ionize the trace gas but insufficient to form undesired ions, such as triply charged carbon.
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Article by Philip T. Smith entitled “The ionization of Helium, Neon, and Argon by Electron Impact”, published by Physical Review, vol. 36, Oct. 15, 1930, pp.1293-1302.
Diep Jeffrey
Geist J. Daniel
Perkins Charles W.
Williams Peter
Berman Jack I
Fishman Bella
McClellan William R.
Smyth Andrew
Varian Inc.
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