Mass spectrometer, especially ICP-MS

Details Mass spectrometer, especially ICP-MS Mass spectrometer, especially ICP-MS

1995-09-22

1997-04-29

Berman, Jack I.

Radiant energy

Ionic separation or analysis

With sample supply means

250281, H01J 4902, G01N 2762, B01J 1902

Patent

active

056251858

ABSTRACT:
In mass spectrometers with a plasma ion source (ICP-MS), a high ion current takes effect on the entrance of the ion optical system. The components provided there, especially lenses and apertures, have hitherto been made of steel. Atoms and ions are released from the surface of the components by a sputtering effect. This results in a correspondingly spoiling background signal and in losses in the quality of the analysis. To avoid the described effects, the components which are subjected to ion bombardment are made of graphite. The sputter rate and the ion yield of the carbon are much lower than those of steel (iron, nickel and chromium).

REFERENCES:
patent: 5191212 (1993-03-01), Falk et al.
patent: 5223711 (1993-06-01), Sanderson et al.
German Patent Office Action re Application No. P 44 33 807.4-33.
Search Report re GB Application No. 9519372.8.
Bello et al., Nuclear Instruments and Methods in Physics Research, B80/81 (1993), pp. 1002-1005.

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