Mass spectrometer beam monitor

Details Mass spectrometer beam monitor Mass spectrometer beam monitor

1979-03-13

1982-09-28

Dixon, Harold A.

Radiant energy

Ionic separation or analysis

Methods

250286, 250295, 2504923, B01D 5944

Patent

active

RE0310433

ABSTRACT:
The ion beam from a field desorption source in a double focusing magnetic mass spectrometer is monitored by disabling the electric sector of the mass analyzer such that the ion beam is not deflected. An opening is provided in the wall of the electric sector such that the undeflected ion beam may pass therethrough to a detector. This permits the characteristics of the field desorption source to be ascertained more quickly and easily so that a mass analysis may be performed. The monitor may be operated automatically to vary a characteristic of the field desorption source until ions are detected. Thereafter, the electric sector is energized and an analysis performed.

REFERENCES:
patent: 2819401 (1958-01-01), Lawrence
patent: 3012139 (1961-12-01), Hanson et al.
patent: 3475604 (1969-10-01), Noda et al.
patent: 3546449 (1970-12-01), Aspinal
patent: 3548188 (1970-12-01), Nemeth
patent: 3602709 (1971-08-01), Hull
patent: 3831026 (1974-08-01), Powers
patent: 3953732 (1976-04-01), Oron et al.
Nuclear Instrument & Method 79 (1970) 55.

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