Mass spectrometer apparatus for analyzing multiple fluid...

Radiant energy – Ionic separation or analysis – With plural – simultaneous ion generators

Reexamination Certificate

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C250S281000, C250S282000, C250S288000

Reexamination Certificate

active

06465776

ABSTRACT:

BACKGROUND OF THE INVENTION
1. Field of the Invention
With the widespread usage of electrospray ionization techniques the atmospheric pressure ionization/mass spectrometer has become the most widely accepted device for chemical analysis. The present invention is also usable in those instances where thermospray ionization is still found to be functionally adequate. Atmospheric pressure interfaces have been used for many different types of mass spectrometers wherein charged droplets are formed in an atmospheric pressure electrospray ionization source which are then transported to a mass spectrometer analyzer through a capillary inlet. Most commercial devices utilize a single electrospray device in conjunction with a singular nozzle. Multiple electrospray needles, or ESI sprayers, have been used to enhance nebulization. Also use of dual ESI sprayers have been tried with a Y-shaped orifice defined within the nozzle in order to investigate electrosprayed proteins using ion-ion or ion-molecule reactions. In particular the accurate measurement of masses of organic compounds has been another use of this system for the purposes of avoiding suppression of the sample by the reference. Standard dual ESI sprayers have also been used in various configurations of mass spectrometer manufacturers. It is important, however, to know that the present invention is particularly novel since only one nozzle has been used heretofore and the spraying mists are mixed prior to entering the first stage of pumping. Automation of the accurate measurement of multiple organic and biological compounds using electrospray ionization has become increasingly important. Double-focusing mass spectrometers have very high resolution and have been used to confirm the chemical composition of organic compounds. However, the more modern time of flight mass spectrometer has been used for chemical composition analysis most recently especially due to their lower cost when compared to double-focusing units. High resolution of the sector instruments is an important factor for achieving high mass accuracy by resolving peak interferences. However, when dealing with the analysis of complex mixtures long scan times used by the sector instrument may not be compatible with the narrow peaks generated under micro and capillary high performance liquid chromatography and capillary electrophoresis. Recent advances in the commonly available configurations of the time-of-flight mass spectrometers have made it possible to acquire complete spectra with adequate resolution during a very short time period. These advances in the time-of-flight mass spectrometer, as well as their lower cost, when compared to double focusing mass spectrometers makes their usage in automated analysis much more cost feasible. The concept of present invention, however, is clearly less expensive and more beneficial using any type of mass spectrometer and is not contemplated to be restricted to only time-of-flight mass spectrometer configurations. The present invention does provide a means for simultaneously measuring multiple fluid sample inputs in a mass spectrometer that is particularly advantageous when utilizing the time-of-flight mass spectrometer.
2. Description of the Prior Art
Numerous prior art devices have been designed in the spectrometer field for enhancing analytical techniques such as shown in U.S. Pat. No. 3,112,639 patented Dec. 3, 1963 to C. T. Maxwell and assigned to Beckman Instruments, Inc. on a “Dual Column Gas Chromatograph And Method For Analysis”; and U.S. Pat. No. 3,119,251 patented Jan. 28, 1964 to M. A. Bowers and assigned to Standard Oil Company on a “Multiple Column Gas Chromatography”; and U.S. Pat. No. 3,236,603 patented Feb. 22, 1966 to L. R. Durrett et al and assigned to Shell Oil Company on a “Multiple-Column Gas Chromatographic Apparatus”; and U.S. Pat. No. 3,449,563 patented Jun. 10, 1969 to H. W. Brown and assigned to Varian Associates on a “Sample Insertion Probe Having Integral Sample Introduction Control Means And Mass Spectrometer Means Using Same”; and U.S. Pat. No. 3,578,969 patented May 18, 1971 to W. Proskauer and assigned to Electronic Associates Inc. on a “Solid Sample Inlet System For A Mass Spectrometer”; and U.S. Pat. No. 3,590,243 patented Jun. 29, 1971 to R. Perrin et al and assigned to Avco Corp. on a “Sample Insertion Vacuum Lock And Probe Assembly For Mass Spectrometers”; and U.S. Pat. No. 3,800,602 patented Apr. 2, 1974 to A. W. Jones and assigned to Hooker Chemical Corporation on a “Multi-Stream Gas Chromatographic Method And Apparatus”; and U.S. Pat. No. 3,916,465 patented Nov. 4, 1975 to A. W. Jones and assigned to Hooker Chemicals & Plastics Corporation on a “Multi-Stream Gas Chromatographic Method And Apparatus”; and U.S. Pat. No. 3,933,047 patented Jan. 20, 1976 to P. Fowler and assigned to Cabot Corporation on a “Method And Means For Gas Sampling In Mass Spectrometry”; and U.S. Pat. No. 4,035,168 patented Jul. 12, 1977 to W. G. Jennings and assigned to The Regents of the University of California on a “Nonreactive Inlet Splitter For Gas Chromatography And Method”; and U.S. Pat. No. 4,201,913 patented May 6, 1980 to W. W. Bursack et al and assigned to Honeywell Inc. on a “Sampling System For Mass Spectrometer”; and U.S. Pat. No. 4,209,696 patented Jun. 24, 1980 to W. Fite on “Methods And Apparatus For Mass Spectrometric Analysis Of Constituents In Liquids”; and U.S. Pat. No. 4,298,795 patented Nov. 3, 1981 to T. Takeuchi et al and assigned to Japan Spectroscopic Co. Ltd. on a “Method And Apparatus For Introducing Samples To A Mass Spectrometer”; and U.S. Pat. No. 4,367,645 patented Jan. 11, 1983 to G. F. Froment and assigned to Kinetics Technology International Corporation on a “Hot Gas Sampling”; and U.S. Pat. No. 4,507,555 patented Mar. 26, 1985 to C. Chang on a “Parallel Mass Spectrometer”; and U.S. Pat. No. 4,562,351 patented Dec. 31, 1985 to P. Atherton et al and assigned to VG Instruments Group Limited on a “Sample Introduction Device For Mass Spectrometers”; and U.S. Pat. No. 4,570,068 patented Feb. 11, 1986 to M. Sakairi et al and assigned to Hitachi, Ltd. on an “Interface For Liquid Chromatograph And Mass Spectrometer”; and U.S. Pat. No. 4,634,865 patented Jan. 6, 1987 to J. K. Conway and assigned to Prutec Limited on an “Introduction Of Samples Into A Mass Spectrometer”; and U.S. Pat. No. 4,634,866 patented Jan. 6, 1987 to J. K. Conway and assigned to Prutec Limited on an “Introduction Of Samples Into A Mass Spectrometer”; and U.S. Pat. No. 4,836,039 patented Jun. 6, 1989 to K. N. de Silva et al and assigned to Canadian Patents & Development Limited on a “Method And Apparatus For Introduction Of A Particulate Sample For Analysis”; and U.S. Pat. No. 4,863,491 patented Sep. 5, 1989 to R. Brandt et al and assigned to Hewlett-Packard on an “Interface For Liquid Chromatography-Mass Spectrometry Systems”; and U.S. Pat. No. 4,879,458 patented Nov. 7, 1989 to R. J. Brunfeldt et al and assigned to R. J. Brunfeldt Company, Inc. on an “Automatic Sample System For Mass Spectrometer”; and U.S. Pat. No. 4,883,958 patented Nov. 28, 1989 to M. L. Vestal and assigned to 501 Vestec Corporation on an “Interface For Coupling Liquid Chromatography To Solid Or Gas Phase Detectors”; and U.S. Pat. No. 4,886,966 patented Dec. 12, 1989 to H. Matsunaga et al and assigned to Kabushiki Kaisha Toshiba on an “Apparatus For Introducing Samples Into An Inductively Coupled, Plasma Source Mass Spectrometer”; and U.S. Pat. No. 4,932,272 patented Jun. 12, 1990 to W. T. Hogg and assigned to Molson Breweries, on a “Liquid Sampling Valve For Gas Chromatograph”; and U.S. Pat. No. 4,933,548 patented Jun. 12, 1990 to R. Boyer et al and assigned to Compagnie Generale des Matieres on a “Method And Device For Introducing Samples For A Mass Spectrometer”; and U.S. Pat. No. 4,977,320 patented Dec. 11, 1990 to S. Chowdhury et al and assigned to The Rockefeller University on an “Electrospray Ionization Mass Spectrometer With New Features”; and U.S. Pat. No. 4,982,090 patented Jan. 1, 1991 to K. Wittmaack and assigned to Gesellschaft fur Strahlen

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