Radiant energy – Ionic separation or analysis – With sample supply means
Patent
1995-05-15
1996-10-01
Berman, Jack I.
Radiant energy
Ionic separation or analysis
With sample supply means
250427, H01J 2720
Patent
active
055612920
ABSTRACT:
An enclosed ion source for generating substantially monoenergetic ions from a gaseous sample comprises a chamber into which the gaseous sample is introduced and which is substantially enclosed by a source block having two electron entrance apertures formed in it and by a source plate having one ion extraction aperture formed in it. Two filaments are disposed outside the chamber and adjacent the electron entrance apertures. The electron impact ion source is characterized by the provision of an electrically conductive shield which is disposed within the chamber and which defines an equipotential region. The electrons, generated from a heated filament, pass into the chamber through one of the electron entrance apertures. The shield allows the passage of molecules of the gaseous sample and the electrons into the equipotential region, so that electron impact ionization of at least some of the sample occurs in the equipotential region. The electron impact source may be incorporated into a conventional mass spectrometer.
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Buckley Mark E.
Koch Ian
Stevenson Andrew
Berman Jack I.
Fisons plc
Nguyen Kiet T.
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