Mass spectrometer

Details Mass spectrometer Mass spectrometer

2011-01-04

2011-01-04

Wells, Nikita (Department: 2881)

Radiant energy

Ionic separation or analysis

C250S282000, C250S283000, C250S288000, C250S3960ML, C250S397000, C250S42300F

Reexamination Certificate

active

07863557

ABSTRACT:
A multi-turn Time of Plight mass analyzer is disclosed comprising a first electric sector (5) and a second electric sector (8). The second electric sector (8) is arranged orthogonal to the first electric sector (5). Ions may make multiple loops or circuits of the mass analyzer before being detected and mass analyzed enabling a high resolution mass analyzer to be provided. According to another embodiment the mass analyzer may have an open-loop geometry wherein the first electric sector is elongated and further electric sectors are arranged in a staggered manner along the length of the first electric sector. The first and second electric sectors (5,8) may be sub-divided into a plurality of electric sector segments.

REFERENCES:
patent: 6998606 (2006-02-01), Buttrill, Jr.
patent: 7247846 (2007-07-01), Buttrill, Jr.
patent: 7427752 (2008-09-01), Jones et al.
patent: 2005/0045817 (2005-03-01), Yamaguchi et al.
patent: 2000243345 (2000-09-01), None
patent: 2001143655 (2001-05-01), None
Toyda, Michisato, et al; Multi-turn time-of-flight mass spectrometers with electrostatic sectors; J. Mass Spectrom, vol. 38, Jan. 1, 2003, pp. 1125-1142.
Ishihara, Morio, et al; Perfect space and time focusing ion optics for multiturn time of flight mass spectrometers; International Journal of Mass Spectrometry 197 (2000) 179, 189, pp. 179-189.

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