Mass spectrometer

Details Mass spectrometer Mass spectrometer

1991-01-11

1991-12-31

Berman, Jack I.

Radiant energy

Ionic separation or analysis

Methods

250288, H01J 4904

Patent

active

050774700

ABSTRACT:
A method of mass spectrometry comprises the steps of ionizing the mixture of the sample and the matrix by repeated irradiation with primary particle beam pulses; introducing the produced ions into a mass analyzer and separating the ions with the mass analyzer according to their mass/charge ratios; detecting signals indicative of the number of the separated ions with an array detector; and integrating the detected signals during data collection periods in synchrony with the irradiation pulses of the primary particle beam. The data collection periods have a predetermined duration and predetermined start times relative to the primary particle beam pulses.

REFERENCES:
patent: 4874944 (1989-10-01), Kato
patent: 4908512 (1990-03-01), Caprioli et al.
"Design and Performance of a Continuous Flow Probe HPLC Interface for a Liquid SMS Time of Flight Mass Spectrometer", Chen et al. presented at the 36th ASMS Conference on Mass Spectrometry and Allied Topics (San Francisco, Calif., Jun. 1988), pp. 809-810.
"Liquid Seconary Ion Time-of-Flight Mass Spectrometry", Analytical Chemistry, vol. 59, No. 7 (Apr. 1987), Olthoff et al., pp. 999-1002.
"Liquid Scondary Ion Mass Spectrometry I. Molecular Ion Intensities as a Function of Primary Ion Pulse Frequency", Olthoff, J. K.; Cotter, R. J., Instruments and Methods in Physics Research B26 (1987), pp. 566-570.
"Evaluation of Pulsed Fast-Atom Bombardment Ionization for Increased Sensitivity of Tandem Mass Spectrometry", Russell et al., Anal. Chem. 61, pp. 153-159.

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