Mass spectrometer

Details Mass spectrometer Mass spectrometer

1975-04-15

1976-06-29

Borchelt, Archie R.

Radiant energy

Ionic separation or analysis

Static field-type ion path-bending selecting means

250396R, B01D 5944, G21K 108

Patent

active

039671160

ABSTRACT:
A mass spectrometer, more particularly for simultaneously measuring beams of a number of species of ions, has a special homogeneous magnetic sector field, the exit boundary of said field forming a straight line which extends through the point of intersection between the central ray of the incident object-ray pencil of ions and the straight entrance boundary of the sector field, and at least one of the emergent image-ray pencils of ions undergoing second-order directional focusing. In this spectrometer, the lateral magnification V lies in the range O .ltoreq. V .ltoreq. 1, the angle of deflection .phi. in the sector field is between 70.5.degree. and 131.8.degree., the angle .epsilon..sub.1 between the central ray of the incident object-ray pencil and the perpendicular erected at the point of intersection between the central ray and the entrance boundary is between 0.degree. and 90.degree., the distance 1.sub.1 between the object point of the ion source and the point of intersection between the central ray of the object-ray pencil and the straight entrance boundary of the sector field is between 0 and infinity, and the distance 1.sub.2 between the image point of the ion source and the point of intersection between the central ray of the second-order directionally-focused image-beam pencil and the straight exit boundary of the sector field is between 0.236 and 0.943.

REFERENCES:
patent: 3135863 (1964-06-01), Hunt
patent: 3202817 (1965-08-01), Belbeoch

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