Mass spectrometer

Details Mass spectrometer Mass spectrometer

1982-07-27

1984-10-30

Anderson, Bruce C.

Radiant energy

Ionic separation or analysis

Static field-type ion path-bending selecting means

250299, 250396R, B01D 5544

Patent

active

044801874

ABSTRACT:
In a mass spectrometer of the magnetic field type for analyzing the mass of ions by causing an ion beam to pass through a narrow slit and then through a deflecting magnetic field to be detected by an ion detector where the intensity of the deflecting magnetic field is varied, plural electrostatic quadrupole lenses are provided between the source slit and the deflecting magnetic field so as to give a converging property to an ion beam passing in a direction vertical to the median plane thereof and to give a diverging property to an ion beam passing in the direction of the radius thereof. This minimizes the gap spacing between the magnetic pole pieces which form the deflecting magnetic field, thereby improving sensitivity and detection as well as accuracy and measurement. Since the magnetic field can be intensified by making the gap spacing between the magnetic pole pieces narrower, the present device is applicable to a wider scope of uses, such as to the analysis of ions of greater mass or ions of higher molecules.

REFERENCES:
patent: 3405363 (1968-10-01), Brown
patent: 3524056 (1970-08-01), Enge et al.
patent: 4078176 (1978-03-01), Matsuda
patent: 4174479 (1979-11-01), Tuithof et al.

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