Mass spectrometer

Radiant energy – Ionic separation or analysis – With sample supply means

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Details

250304, H01J 4904

Patent

active

048033553

ABSTRACT:
A mass spectrometer includes apparatus for irradiating a target with a primary beam, apparatus for forwarding the target from the outside of a vacuum chamber, apparatus for analyzing the mass of secondary ions emitted by the target, and apparatus for collecting data on the secondary ions thus mass-analyzed. Further, apparatus is provided for synchronizing the timing for the forwarding of the target and that for the data collection and for stopping substantially the data collection during a predetermined period of time (T) after the stopping of the forwarding of the target.

REFERENCES:
patent: 3508045 (1970-04-01), Andersen et al.

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