Mass spectrometer

Details Mass spectrometer Mass spectrometer

2007-05-01

2007-05-01

Wells, Nikita (Department: 2881)

Radiant energy

Ionic separation or analysis

Cyclically varying ion selecting field means

C250S292000, C250S281000, C250S282000, C250S42300F

Reexamination Certificate

active

10796645

ABSTRACT:
An improved FT-ICR Mass Spectrometer has an ion source10which generates ions that are transmitted through a series of multipoles20to an ion trap30. Ions are ejected from the trap30, through a series of lens and multipolar ion guide stages40–90, and into a measurement cell100via an exit/gate lens110. The measurement cell is mounted in a vacuum chamber240and this assembly is slideably moveable into a bore of a superconducting magnet400which provides the magnetic filed to cause cyclotron motion of the generated ions in the cell100. By minimising the distance between the source10and cell100, and by careful alignment of the ion optics, the ions can travel at high energies right up to the front of the measurement cell100.The cell100extends in the longitudinal direction of the magnet bore and is coaxial with that. The ratio of the sectional area of the magnet bore to the sectional area of the cell volume is small (less than 3). The magnet is asymmetric and is relatively short on the ion injection side. The cell100is supported from in front of the cell and electrical contact is from the rear thereof.

REFERENCES:
patent: 4535235 (1985-08-01), McIver, Jr.
patent: 4686365 (1987-08-01), Meek et al.
patent: 5389784 (1995-02-01), Weller
patent: 6720555 (2004-04-01), O'Connor
patent: 6727699 (2004-04-01), Kasten
patent: 2002/0079444 (2002-06-01), Senko
patent: 2004/0217272 (2004-11-01), Horning et al.
patent: 2353632 (2001-02-01), None
patent: 5054852 (1993-03-01), None
patent: 9055186 (1997-02-01), None
patent: WO 03/060945 (2003-07-01), None
Ghaffari et al., “Experimental Evidence for Chaotic Transport in a Positron Trap”, Physical Review Letters, vol. 75, No. 17, Oct. 23, 1995, pp. 3118-3121.
PCT Search Report (Form PCT/ISA/210) issued by the European Patent Office in PCT Application No. PCT/EP2004/002486, 7 pages.
Senko, Michael W., et al., “External Accumulation of Ions for Enhanced Electrospray Ionization Fourier Transform Ion Cyclotron Resonance Mass Spectrometry”, Journal of the American Society for Mass Spectrometry, vol. 8, pp. 970-976, 1997.
Alford, J.M., et al., “Metal Cluster Ion Cyclotron Resonance: Combining Supersonic Metal Cluster Beam Technology with FT-ICR”, International Journal of Mass Spectrometry and Ion Processes, vol. 72, pp. 33-51, 1986.
Senko, Michael W., et al., “Electrospray Ionization Fourier Transform Ion Cyclotron Resonance at 9.4 T”, Rapid Communications in Mass Spectrometry, vol. 10, pp. 1824-1828, 1996.
Beu, Steven C., “Fourier-Transform Electrospray Instrumentation for Tandem High-Resolution Mass Spectrometry of Large Molecules”, Journal of the American Society for Mass Spectrometry, vol. 4, pp. 557-565, 1993.
Hunter, et al., “An Elongated Trapped-Ion Cell for Ion Cyclotron Resonance Mass Spectrometry with a Superconducting Magnet”, International Journal of Mass Spectrometry and Ion Physics, 50 (1983) 259-274.
Naito et al., “Improvement of the Electric Field in the Cylindrical Trapped-Ion Cell”, International Journal of Mass Spectrometry and Ion Processes , 120 (1992) 179-192.
Frankevich et al., “Dynamic Ion Trapping in a Cylindrical Open Cell for Fourier Transform Ion Cyclotron Resonance Mass Spectrometry”, International Journal of Mass Spectrometry 207 (2001) 57-67.
Partial International Search Report from corresponding International Patent Cooperation Treaty Application No. PCT/EP2004/002486 dated Oct. 6, 2005.

Affiliated with

Also associated with

Rating

Mass spectrometer does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Mass spectrometer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Mass spectrometer will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3817108