Mass spectrometer

Details Mass spectrometer Mass spectrometer

1983-01-17

1985-06-04

Anderson, Bruce C.

Radiant energy

Ionic separation or analysis

Static field-type ion path-bending selecting means

250282, 250283, 250294, B01D 5944

Patent

active

045216878

ABSTRACT:
A mass spectrometer and process for using same comprises an ion source, a first field, a second field and a field-free region between the first and second fields. Parent ions are mass-selected by said first field and daughter ions are formed in the field-free region by ion dissociation or ion fragmentation. The daughter ions are dispersed by the second field. Superimposed electric and magnetic fields are used as the second field, the intensity of said magnetic field being changed from a first stage to a second stage and the intensity of said electric field being swept under both stages. Both energy and mass of the daughter ions can be measured by this mass spectrometer.

REFERENCES:
patent: 3610921 (1971-10-01), Major
patent: 3673404 (1972-06-01), Major
patent: 3769513 (1973-10-01), Delany
patent: 3803410 (1974-04-01), Banner
patent: 4054796 (1977-10-01), Naito

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