Mass resolution in time-of-flight mass spectrometers with reflec

Details Mass resolution in time-of-flight mass spectrometers with reflec Mass resolution in time-of-flight mass spectrometers with reflec

1996-04-04

1997-08-05

Berman, Jack I.

Radiant energy

Ionic separation or analysis

Ion beam pulsing means with detector synchronizing means

250282, H01J 4940

Patent

active

056545452

ABSTRACT:
A method for the high resolution analysis of analyte ions in a time-of-flight mass spectrometer. The method consists of the generation of an intermediate time-focus plane for ions of a certain mass at a location between an ion source and an ion reflector, and then using the ion reflector to temporally focus the ions of equal mass and differing velocities which pass this plane at the same time onto a detector. For time-of-flight mass spectrometers with an ion selector, the ion selector is particularly favorable location for this intermediate plane with time focus; and with a collision cell for the collision fragmentation of the ions, the collision cell is a particularly favorable location.

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patent: 5504326 (1996-04-01), Reilly et al.
patent: 5510613 (1996-04-01), Reilly et al.
A Duckworth et al., Analysis of laser-ablated solid samples using a small time of flight mass spectrometer, Meas. Sci. Technol. vol. 3, pp. 596-602, 1992.
Johann M. Grundwurmer et al., High-resolution mass spectrometry in a linear time-of-flight mass spectrometer, International Journal of Mass Spectrometry and Ion Processes, vol. 131, pp. 139-148, 1994.
Hellmut Haberland et al., Converting a reflection time-of-flight mass spectrometer into a tandem instrument, Rev. Sci. Instrum. vol. 62, pp. 2368-2371, Oct. 1991.

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