Mass-analyzing method

Radiant energy – Ionic separation or analysis – Methods

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C250S288000, C250S283000, C250S281000, C422S068100, C702S027000, C702S023000, C702S022000

Reexamination Certificate

active

07544931

ABSTRACT:
In a mass analysis of a sample, candidate compositions Y of a fragment ion produced by a dissociating operation are deduced from the mass of that fragment ion (Steps S6to S9). If the number of the candidates Y is larger than a predetermined value (“No” in Step S10), the repetition counter of the dissociating operation is increased by one and the mass analysis of the fragment ion is performed again. If the number of the candidates is equal to or smaller than the predetermined value, the difference between the masses of the fragment ions before and after each mass-analyzing stage is calculated (Step S11). From this mass difference, the candidates Z of the desorption ion at each stage is deduced (Step S12). These candidates Z and Y are used to narrow down the candidate composition formulae X deduced from the mass of the precursor ion (Step S13). If the number of the candidates has decreased to one or become equal to or smaller than a predetermined value, the result is displayed (Steps S14and S15). Thus reducing the number of the candidates to the lowest possible value, the present method provides the user with useful information for analyzing the molecular structure and/or composition of a sample having a large molecular weight.

REFERENCES:
patent: 6745134 (2004-06-01), Kobayashi et al.
patent: 6787767 (2004-09-01), Kato
patent: 7429727 (2008-09-01), Bern
patent: 2003/0108876 (2003-06-01), Speir
patent: 2004/0169138 (2004-09-01), Ootake et al.
patent: 2006/0085142 (2006-04-01), Mistrik
patent: 2006/0255263 (2006-11-01), Ishimaru et al.
patent: 2008/0073501 (2008-03-01), Yamaguchi et al.
patent: 8-124519 (1996-05-01), None
patent: 10-142196 (1998-05-01), None
patent: 11-64285 (1999-03-01), None
patent: 2001-249114 (2001-09-01), None
patent: 2002-505443 (2002-02-01), None
patent: 2004-28782 (2004-01-01), None
patent: 2004-257922 (2004-09-01), None
patent: 9945150 (1999-09-01), None
International Search Report of PCT/JP2005/019728, date of mailing Jan. 24, 2006.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Mass-analyzing method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Mass-analyzing method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Mass-analyzing method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4062178

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.