Mass analyzer system with reduced drift

Details Mass analyzer system with reduced drift Mass analyzer system with reduced drift

1986-10-20

1988-05-24

Fields, Carolyn E.

Radiant energy

Ionic separation or analysis

With sample supply means

250281, H01J 4926

Patent

active

047467940

ABSTRACT:
A mass analyzer in which an ion signal, typically from a plasma, travels through an orifice into a vacuum chamber, and through a focussing system in the vacuum chamber into a mass spectrometer and ion detector. Drift of the detected ion signal, and differences in drift of the detected ion signal for different elements, are greatly reduced by a small shadow stop placed in the vacuum chamber immediately behind the orifice. The shadow stop and plate containing the orifice are both preferably grounded. The focussing system includes a Bessel box lens, and drift is further reduced by insulating the stop in the Bessel box lens from the barrel and biasing the Bessel stop differently from the barrel.

REFERENCES:
patent: 4135094 (1979-01-01), Hull
patent: 4146787 (1979-03-01), Fite
patent: 4148196 (1979-04-01), French et al.
patent: 4328420 (1982-05-01), French

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