Masking technique usable in manufacturing semiconductor devices

Metal working – Method of mechanical manufacture – Assembling or joining

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

29576B, 29584, 357 91, B01J 1700

Patent

active

042324394

ABSTRACT:
A semiconductor layer different in material from a semiconductor substrate formed on at least one part of the surface of the substrate is partially removed in accordance with a planar configuration forming technique employing irradiation of a radiation such as light, electron beam or X-rays to form a residual layer and ion beams are applied to the upper surface or the substrate at an incidence angle less than 90 degrees so that a non-etching region is formed at the region of the substrate other than the region around and beneath said residual layer according to mutual relationships between the configuration of the residual layer and the incidence angle of the ion beams.

REFERENCES:
patent: 3258898 (1966-07-01), Garibotti
patent: 3914857 (1975-10-01), Goser
patent: 4086694 (1978-05-01), U

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Masking technique usable in manufacturing semiconductor devices does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Masking technique usable in manufacturing semiconductor devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Masking technique usable in manufacturing semiconductor devices will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1685071

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.