Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal – Responsive to electromagnetic radiation
Reexamination Certificate
2011-03-08
2011-03-08
Richards, N Drew (Department: 2895)
Semiconductor device manufacturing: process
Making device or circuit responsive to nonelectrical signal
Responsive to electromagnetic radiation
C257S292000, C438S075000, C438S799000, C438S949000
Reexamination Certificate
active
07901974
ABSTRACT:
A technique for fabricating an array of imaging pixels includes fabricating front side components on a front side of the array. After fabricating the front side components, a dopant layer is implanted on a backside of the array. A mask is formed over the dopant layer to selectively expose portions of the dopant layer. Next, the exposed portions of the dopant layer are laser annealed. Alternatively, the mask may be disposed over the backside prior to the formation of the dopant layer and the dopants implanted through the exposed portions and subsequently laser annealed.
REFERENCES:
patent: 5688715 (1997-11-01), Sexton et al.
patent: 5911106 (1999-06-01), Tasaka
patent: 6019796 (2000-02-01), Mei et al.
patent: 6124179 (2000-09-01), Adamic, Jr.
patent: 2001/0044175 (2001-11-01), Barrett et al.
patent: 2006/0006488 (2006-01-01), Kanbe
patent: 2007/0207566 (2007-09-01), Fu et al.
patent: WO/94/14188 (1994-06-01), None
Sameshima, T. et al., “Improvement of SiO2 Properties and Silicon Surface Passivation by Heat Treatment with High-Pressure H2O Vapor”, Japan Journal of Applied Physics, vol. 37, Part 2, No. 12A, Dec. 1, 1998, pp. L1452-L1454, Japan Journal of Applied Physics Publication Board, Japan.
Takato, H. et al., “Surface Passivation Effect of Silicon Substrates due to Quinhydrone/Ethanol Treatment”, Japan Journal of Applied Physics, vol. 40, Part 2, No. 10A, Oct. 1, 2001, pp. L1003-L1004,The Japan Society of Applied Physics, Japan.
Schmidt, J. et al., “Surface passivation of silicon solar cells using plasma-enhanced chemical-vapor-deposited SiN films and thin thermal SiO2/plasma SiN stacks”, Semiconductor Science and Technology, vol. 16, 2001, pp. 164-170, Institute of Physics Publishing, United Kingdom.
Kurita, K. et al., “Low Surface Recombination Velocity on Silicon Water Surfaces due to Iodine-Ethanol Treatment”, Japanese Journal of Applied Physics, vol. 38, Part 1, No. 10, Oct. 1999, pp. 5710-5714, Japan Journal of Applied Physics Publication Board, Japan.
Mao Duli
Qian Yin
Tai Hsin-chih
Venezia Vincent
Blakely , Sokoloff, Taylor & Zafman LLP
Carpenter Robert
OmniVision Technologies Inc.
Richards N Drew
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