Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
Patent
1997-10-03
1998-09-01
Edwards, Laura
Coating processes
Measuring, testing, or indicating
Thickness or uniformity of thickness determined
427 96, 427272, 427282, 118504, 118505, 101127, B05D 100
Patent
active
058008560
ABSTRACT:
A mask stencil (112) is made with at least one indicator line (204, 205) of material pre-removed from a wear surface (212) of the mask stencil, the depth of the line is approximately the amount of stencil mask material that can be worn from the wear surface of the mask stencil by a squeegee (110) without adversely affect an amount of solder paste (114) that accumulates on a printed circuit board substrate (116) through openings (201) in the mask stencil. In another embodiment, the mask stencil (112) is made with at least one indicator line (304, 305) of material pre-removed from a surface opposite (314) the wear surface (312). The amount of stencil mask material that remains above the indicator line is approximately equal to the amount of material that can be worn from the wear surface of the mask stencil by the squeegee without adversely affect an amount of solder paste that accumulates on the printed circuit board.
REFERENCES:
patent: 5232736 (1993-08-01), Tribbey et al.
patent: 5436028 (1995-07-01), Becher et al.
Edwards Laura
Motorola Inc.
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