Mask for X-ray lithography and method of manufacturing the same

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

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430 22, 430321, 430966, 378 35, 2504911, G03F 900

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active

051321866

ABSTRACT:
A mask for X-ray lithography includes a transparent thin film (1) of SiC, an X-ray absorbing pattern (2) of Au formed on the surface of the transparent thin film (1) and a support member (3) of Si formed on the back surface of the transparent thin film (1). The support member (3) has an opening (4) for exposing the back surface of the transparent thin film (1). A transparent conductive thin film (5) of In.sub.2 O.sub.3 is formed over the back surfaces of the exposed transparent thin film (1) and the support member (3).

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patent: 4468799 (1984-08-01), Harms et al.
patent: 4595649 (1986-06-01), Ferguson et al.
patent: 4680243 (1987-07-01), Shimkunas
patent: 4939052 (1990-07-01), Nagagawa
patent: 5023156 (1991-06-01), Takeuchi et al.
JP 56-66037, "X-Ray Mask", Tanaka, Japanese Patent Abstract, Jun. 4, 1981.
JP 61-128,251, "Mask for X-Ray Exposure", Chiba, Japanese Patent Abstract, Jun. 16, 1986.
Solid State Technology: "X-Ray Lithography", by R. K. Watts, May 1979, pp. 68-82.
Spie, Submicrom Lithography: "X-Ray Lithography: Fabrication of Masks and Very Large Scale Integrated Devices", by B. B. Triplette et al., vol. 333, 1982, pp. 118-123.
Spie Electron Beam, X-Ray & Ion-Beam Techniques for Sub-Micrometer Lithographies III: "Defect Repair Techniques for X-Ray Masks" by D. K. Atwood et al., vol. 471, 1984, pp. 127-134.

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