Measuring and testing – Display or display device details
Patent
1995-12-18
1997-04-08
Raevis, Robert
Measuring and testing
Display or display device details
434427, G01D 702
Patent
active
056189982
ABSTRACT:
An apertured mask for enhancing the learning of specific functions controllable from an instrument panel by a trainee. In one embodiment, the mask for an instrument panel comprises an opaque overlay having at least one opening for revealing a group of instruments from this panel, and mounting means for retaining this overlay in a fixed relationship with the exclusive group of instruments. A plurality of juxtaposed flaps may also be provided for optionally covering a portion or an entirety of the opening of the mask. In another embodiment, any two juxtaposed flaps have along a common bordering edge thereof dust seal means for closing a gap between each flap. In a further embodiment, each mask from a plurality of masks for a same instrument panel, has a distinct set of apertures for revealing a distinct number of exclusive instruments from that panel, for teaching a trainee about a distinct process from a group of processes controllable from that instrument panel.
REFERENCES:
patent: 2167131 (1939-07-01), Weidenborner
patent: 3699789 (1972-10-01), Potzick
patent: 4475366 (1984-10-01), Marneris
patent: 4728294 (1988-03-01), Bredehorn
patent: 4886457 (1989-12-01), Lon-Jeng
patent: 5096317 (1992-03-01), Phillippe
patent: 5419704 (1995-05-01), North
Raevis Robert
Theriault Mario D.
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