Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate
2005-10-18
2005-10-18
Lee, Hsien-Ming (Department: 2823)
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
C438S708000, C438S942000, C430S005000, C430S312000
Reexamination Certificate
active
06955993
ABSTRACT:
A mask capable of alignment by the TTR system and complementary division and having a high strength, a method of production of the same, and a method of production of a semiconductor device having a high pattern accuracy are provided. A stencil mask having stripe-shaped grid lines4formed by etching a silicon wafer in four sub-regions A to D on a membrane, having the stripes arranged point symmetrically about a center of the membrane, and having all of the grid lines connected to other grid lines or the silicon wafer around the membrane (support frame), a method of production of the same, and a method of production of a semiconductor device using the mask.
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Moriya Shigeru
Omori Shinji
Depke Robert J.
Lee Hsien-Ming
Trexler, Bushnell, Blackstone, Giangiorgi & Marr
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