Marking techniques for identifying integrated circuit parts at t

Details Marking techniques for identifying integrated circuit parts at t Marking techniques for identifying integrated circuit parts at t

1990-07-13

1991-08-27

Wieder, Kenneth A.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, 29574, G01R 1512, G01R 1700

Patent

active

050436570

ABSTRACT:
A technique for "marking" integrated-circuit (IC) chips so that, when large lots of the chips are drift-tested at different temperatues, each chip can be identified positively so as to be associated with the test data accumulated for the particular chip. The technique includes forming additional resistors on each IC chip with the resistors connected in series and to a voltage supply. The resistors are timmed at the wafer stage to produce at nodal points between the resistors voltages having magnitudes which uniquely identify each particular chip, thereby to permit part-identified tests to be performed after the chips have been packaged as parts ready for shipment.

REFERENCES:
patent: 4255851 (1981-03-01), Fortuna
patent: 4437229 (1984-03-01), Bitler et al.
patent: 4646238 (1987-02-01), Carlson Jr. et al.
patent: 4853628 (1989-08-01), Gouldsberry et al.
patent: 4918377 (1990-04-01), Buehler et al.

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