Marking method and sheet for both protective film forming...

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Making plural separate devices

Reexamination Certificate

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C438S464000, C257SE21599

Reexamination Certificate

active

07935574

ABSTRACT:
The invention provides a marking method in which marking is performed on a protective film formed on a work with a high accuracy while suppressing a warpage and, also, a sheet for both protective film forming and dicing which is advantageously used in the method. The marking method comprises irradiating laser light to a laminated structure comprising a support film tensely supported by a ring frame, a protective film releasably laminated on the support film and a work fixed to the protective film, wherein the protective film is irradiated laser light from a side of the support film, to thereby mark the protective film.

REFERENCES:
patent: 4753863 (1988-06-01), Spanjer
patent: 6147374 (2000-11-01), Tanaka et al.
patent: 6284185 (2001-09-01), Tokuda et al.
patent: 6806725 (2004-10-01), Tsui et al.
patent: 6919262 (2005-07-01), Senoo et al.
patent: 2001/0042902 (2001-11-01), Wakabayashi et al.
patent: 2004/0033375 (2004-02-01), Mori
patent: 2005/0126686 (2005-06-01), Cheong et al.
patent: 2002-280329 (2002-09-01), None
patent: 2004-214288 (2004-07-01), None

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