Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-09-12
2006-09-12
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
Reexamination Certificate
active
07107165
ABSTRACT:
A user interface for an electronic instrument includes a display that displays a signal and a band marker. The band marker demarks a bandwidth of the signal by marking both a start frequency of the bandwidth and a stop frequency of the bandwidth. The electronic instrument performs a function on the bandwidth of the signal between the start frequency and the stop frequency.
REFERENCES:
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patent: 5075618 (1991-12-01), Katayama
patent: 5617523 (1997-04-01), Imazu et al.
Merriam-Webster's dictionary Tenth edition, 1993., p. 929.
Measurement Guide and Programming Examples, Agilent Technologies PSA Series Spectrum Analyzers, Agilent Technologies Manufacturing Part No. E4440-90063, May 2002, Available from Agilent Technologies, Inc., www.Agilent.com., pp. 1-72.
Agilent Spectrum Analyzer Measurements and Noise, Application Note 1303, Agilent Technologies Manufacturing Part No. 5966-4008E, Feb. 11, 2003, Available from Agilent Technologies, Inc., www.Agilent.com.
Boyan Corydon Joseph
Ferrel Michael
Gorin Joseph Michael
Nelson Robert Nathan
Agilent Technologie,s Inc.
Bui Bryan
Lau Tung S.
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