Mark embedding and detection using projective transforms

Details Mark embedding and detection using projective transforms Mark embedding and detection using projective transforms

2007-12-25

2007-12-25

Ahmed, Samir (Department: 2624)

Image analysis

Applications

C382S276000, C382S302000

Reexamination Certificate

active

10660623

ABSTRACT:
A method (200) is disclosed of detecting one or more patterns embedded in an image. Each pattern embedded in the image has been formed from a one-dimensional basis function. The method (200) starts by calculating (210) a projective transform of the image. A 1-D correlation is then calculated (220) between the projective transform and the basis function for a selection of angles. Finally, one or more peaks of the correlation are found (230). The position of each of the peaks provides spatial parameters of one of the one or more embedded patterns.

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