Mapping variations in local temperature and local power...

Details Mapping variations in local temperature and local power... Mapping variations in local temperature and local power...

2006-07-04

2006-07-04

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S763010, C702S132000

Reexamination Certificate

active

07071723

ABSTRACT:
A method includes providing an integrated circuit (IC) having a plurality of oscillators at distributed locations in the IC, determining a respective rate of oscillation of each of the oscillators, and detecting variations in local temperature in the IC based on the determined rates of oscillation. Other embodiments are described and claimed.

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