Mapping a surface of a workpiece

Geometrical instruments – Gauge – With support for gauged article

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33551, G01B 520, G01B 1124

Patent

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053218949

ABSTRACT:
The roughness of an area of the surface of a workpiece (W) is measured by bringing a height measuring device (10) to points on the surface and using the device to measure the height of each point relative to a datum level defined by a skid (17) while the device (10) is stationary relative to the surface. The points are arranged in a repetitive pattern in two dimensions across the area. The movement between the points is brought about by orthogonally arranged stepping motors (20,22).

REFERENCES:
patent: 3501841 (1970-03-01), Adams
patent: 4377911 (1983-03-01), Iida et al.
patent: 4516326 (1985-05-01), Calcagno, Jr.
patent: 4662074 (1987-05-01), Knapp et al.
patent: 4679331 (1987-07-01), Koontz
Patent Abstracts of Japan vol. 9, No. 62 (P-342) (1785) Mar. 1985 & JP-A-59 196 405 Nov. 1984.
J. of Physics E. Scientific Instruments vol. 9, No. 10, Oct. 1976 Ishing Bristol GB pp. 855-861 Sayles et al "Mapping A Small Area of a Surface".

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