Manufacturing method of semiconductor device which includes form

Fishing – trapping – and vermin destroying

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437241, H01L 21316, H01L 21318

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055785301

ABSTRACT:
In a manufacturing method of semiconductor device having a fluorine-containing SiN layer, an SiN layer excellent in the step coverage can be formed using as raw material an Si compound containing at least both nitrogen and fluorine, by virtue of an intermediate product which, during the formation of the above SiN layer, is formed, liable to polymerization and has fluidity. Moreover, as the above Si compound contains fluorine that is taken into the formation of the fluorine-containing SiN layer whose dielectric constant is lowered thereby, delay in circuit operation due to parasitic capacitances can be reduced.

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Billy, Michel, "Nitrogens Compounds of Silicon Formed by the Reaction of Ammonium Halides with the Imide SiN.sub.2 H.sub.2 ", Compt. Rend., 248, 807-10 (1959).
Billy, Michel, "Preparation and Definition of a Silicon Nitride", Ann. Chim. (Paris) [13], 4, 795-851 (1959).

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