Manufacturing method of semiconductor device and...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Junction field effect transistor

Reexamination Certificate

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Details

C257S276000, C257S338000, C257S369000, C257S374000, C438S221000, C438S227000, C438S296000, C438S424000

Reexamination Certificate

active

06984855

ABSTRACT:
A semiconductor device comprising a buried insulating film formed in a substrate; a protective film formed on the buried insulating film covering corresponding diffusion regions of a P-type MISFET and a N-type MISFET, wherein the protective film is etch resistant to a hydrofluoric acid based solution; and a wiring layer formed on the protective film and being electrically connecting the diffusion regions of the P-type MISFET and the N-type MISFET.

REFERENCES:
patent: 6303418 (2001-10-01), Cha et al.
patent: 6319784 (2001-11-01), Yu et al.
patent: 6411548 (2002-06-01), Sakui et al.
patent: 6506647 (2003-01-01), Kuroda et al.
patent: 06-168955 (1994-06-01), None
patent: 08-250716 (1996-09-01), None
patent: 11-340456 (1999-10-01), None
patent: 2002-110997 (2002-04-01), None
patent: 2002-231938 (2002-08-01), None
patent: 2003-037115 (2003-02-01), None

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