Single-crystal – oriented-crystal – and epitaxy growth processes; – Processes of growth from liquid or supercritical state – Having pulling during growth
Reexamination Certificate
2007-11-27
2007-11-27
Hiteshew, Felisa (Department: 1722)
Single-crystal, oriented-crystal, and epitaxy growth processes;
Processes of growth from liquid or supercritical state
Having pulling during growth
C117S020000
Reexamination Certificate
active
11194470
ABSTRACT:
A manufacturing method of a hydrogen-doped silicon single crystal. A silicon single crystal is grown under an inert atmosphere containing hydrogen in a CZ pulling furnace comprising a pull chamber connected to a main chamber. At least one portion of a mixed gas composed of a hydrogen gas and an inert gas to be introduced into the CZ pulling furnace is supplied directly to a surface of a silicon melt in the main chamber, preferably to adjacent parts to a solid-liquid interface of the surface thereof, or in the silicon melt.
REFERENCES:
patent: 61-178495 (1986-08-01), None
patent: 11-189495 (1999-07-01), None
patent: 2000-281491 (2000-10-01), None
patent: 2001-335396 (2001-12-01), None
Hourai Masataka
Sugimura Wataru
Hiteshew Felisa
Pillsbury Winthrop Shaw & Pittman LLP
Sumco Corporation
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